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? Programmable scan sequence
? Up to 8 configurable samples in scan sequence
? Mask to select which pins are included in the sequence
? Triggered by software or PRS input
? One shot or repetitive mode
? Oversampling available
? Overflow interrupt flag set when overwriting unread results
? Conversion tailgating support for predictable periodic scans
? Programmable single conversion
? Triggered by software or PRS input
? Can be interleaved between two scan sequences
? One shot or repetitive mode
? Oversampling available
? Overflow interrupt flag set when overwriting unread results
? Hardware oversampling support
? 1st order accumulate and dump filter
? From 2 to 4096 oversampling ratio (OSR)
? Results in 16-bit representation
? Enabled individually for scan sequence and single sample mode
? Common OSR select
? Individually selectable voltage reference for scan and single mode
? Internal 1.25V reference
? Internal 2.5V reference
? V DD
? Internal 5 V differential reference
? Single ended external reference
? Differential external reference
? Unbuffered 2xV DD
? Support for offset and gain calibration
? Interrupt generation and/or DMA request
? Finished single conversion
? Finished scan conversion
? Single conversion results overflow
? Scan sequence results overflow
? Loopback configuration with DAC output measurement
25.3 Functional Description
An overview of the ADC is shown in Figure 25.1 (p. 343) .
2011-04-12 - d0001_Rev1.10
342
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